发明名称 NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <p>A method for easily manufacturing a nitride semiconductor device having an epitaxial film which is excellent in flatness and crystallinity and a nitride semiconductor device manufactured by such a method are disclosed. The method for manufacturing a nitride semiconductor device that is formed on a semiconductor substrate composed of a compound containing nitrogen and a group 3B element that forms a compound with nitrogen comprises a step wherein a film-forming gas containing a group 3B element material gas and a nitrogen material gas is supplied while heating a semiconductor substrate (1) to a film-forming temperature and a thin film (2) of the compound containing the group 3B element and nitrogen is epitaxially grown on the semiconductor substrate. Before this epitaxial growth step, the method comprises a step wherein the surface of the semiconductor substrate is cleaned by heating the semiconductor substrate to a pre-processing temperature that is lower than the film-forming temperature.</p>
申请公布号 WO2004079803(A1) 申请公布日期 2004.09.16
申请号 WO2004JP01944 申请日期 2004.02.19
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;KYONO, TAKASHI;UENO, MASAKI 发明人 KYONO, TAKASHI;UENO, MASAKI
分类号 C23C16/02;C23C16/34;C30B25/02;H01L21/205;H01L33/32;(IPC1-7):H01L21/205;H01L21/31 主分类号 C23C16/02
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