发明名称 |
NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>A method for easily manufacturing a nitride semiconductor device having an epitaxial film which is excellent in flatness and crystallinity and a nitride semiconductor device manufactured by such a method are disclosed. The method for manufacturing a nitride semiconductor device that is formed on a semiconductor substrate composed of a compound containing nitrogen and a group 3B element that forms a compound with nitrogen comprises a step wherein a film-forming gas containing a group 3B element material gas and a nitrogen material gas is supplied while heating a semiconductor substrate (1) to a film-forming temperature and a thin film (2) of the compound containing the group 3B element and nitrogen is epitaxially grown on the semiconductor substrate. Before this epitaxial growth step, the method comprises a step wherein the surface of the semiconductor substrate is cleaned by heating the semiconductor substrate to a pre-processing temperature that is lower than the film-forming temperature.</p> |
申请公布号 |
WO2004079803(A1) |
申请公布日期 |
2004.09.16 |
申请号 |
WO2004JP01944 |
申请日期 |
2004.02.19 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD.;KYONO, TAKASHI;UENO, MASAKI |
发明人 |
KYONO, TAKASHI;UENO, MASAKI |
分类号 |
C23C16/02;C23C16/34;C30B25/02;H01L21/205;H01L33/32;(IPC1-7):H01L21/205;H01L21/31 |
主分类号 |
C23C16/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|