发明名称 |
PHOTORESIST WASHING LIQUID COMPOSITION, PATTERN FORMATION METHOD USING THE COMPOSITION AND SEMICONDUCTOR DEVICE PREPARED BY USING THE METHOD |
摘要 |
PURPOSE: A photoresist washing liquid composition, a method for forming a photoresist pattern by using the composition and a semiconductor device prepared by using the method are provided to reduce surface tension, thereby reducing the collapse of a pattern when a semiconductor substrate is washed in the final step of development. CONSTITUTION: The photoresist washing liquid composition comprises water as a main component; 0.001-2 wt% of a surfactant represented by the formula 1 as an additive; and optionally 0-20 wt% of an alcohol, wherein R is an alkyl group of C8-C20 or an aromatic group of C3-C20; x, y and z are an integer of 0-10; and n is an integer of 3-50. Preferably the alcohol is selected from the group consisting of a C1-C10 alkyl alcohol and a C1-C10 alkoxy alcohol.
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申请公布号 |
KR20040079759(A) |
申请公布日期 |
2004.09.16 |
申请号 |
KR20030014796 |
申请日期 |
2003.03.10 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BOK, CHEOL GYU;HWANG, YEONG SEON;LEE, GEUN SU;MUN, SEUNG CHAN;SHIN, GI SU |
分类号 |
G03F7/32;(IPC1-7):G03F7/32 |
主分类号 |
G03F7/32 |
代理机构 |
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主权项 |
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地址 |
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