SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME WITHOUT USING AN ADDITIONAL PIN

摘要

PURPOSE: A semiconductor device and a method for testing the same are provided to perform a high frequency test process by using an existing CLK1 and CLK2 pin without using an additional pin. CONSTITUTION: A semiconductor device includes a selection circuit, a selection signal generation circuit, and a logic combination unit. The selection circuit(11) is used for generating three clocks according a predetermined selection signal in response to two clocks having a predetermined phase difference. The selection signal generation circuit(12) is used for outputting the predetermined selection signal to the selection circuit. The logic combination unit combines locally three clock signals in order to output the same frequency clock as two clocks when the selection signal is the first level signal to an internal circuit(15) or output higher frequency clock than two clocks when the selection signal is the second level signal to the internal circuit.