DEVICE AND METHOD FOR THE TOLERANCE ANALYSIS OF DIGITAL AND/OR DIGITALISED MEASURING VALUES

摘要

The invention relates to an electrical tolerance analysis circuit for the tolerance analysis of digital and digitalised measuring values, said circuit comprising inputs for receiving a measuring value (chirho), a reference value (Chii) and a tolerance value (DeltaChiq), and an output for emitting an output value (Chia). The electrical tolerance analysis circuit also comprises an examination device (42, 43) for examining the measuring value (Chip) on the basis of at least one pre-determinable tolerance criteria, and an output device for outputting an output value (Chia) which indicates, according to the state of the examination device (42, 43), whether the measuring value (Chip) fulfils the respectively pre-determined tolerance criteria or not.