发明名称 MULTIRATE PROCESSING FOR METROLOGY OF PLASMA RF SOURCE
摘要 An RF generator is provided for use in an RF plasma system. The RF generator includes: a power source that is operable to generate RF power signals at a tuned frequency; a sensor unit that is adapted to detect the RF power signals and operable to generate analog signals representative of the RF power signals, where the analog signals include a frequency of interest and a plurality of interfering frequency components; and a sensor signal processing unit that is adapted to receive the analog signals from the sensor unit and to band limit the analog signals within a predefined bandwidth that passes the frequency of interest and rejects interfering frequency components.
申请公布号 WO2004008502(A3) 申请公布日期 2004.09.10
申请号 WO2003US11266 申请日期 2003.04.14
申请人 ENI TECHNOLOGY, INC.;COUMOU, DAVID, J.;KIRK, MICHAEL, L. 发明人 COUMOU, DAVID, J.;KIRK, MICHAEL, L.
分类号 H05H1/46;H01J37/32;H01L21/3065;H03H17/06 主分类号 H05H1/46
代理机构 代理人
主权项
地址