发明名称 |
QUALITY EVALUATION METHOD AND GENERATION METHOD FOR DELAY FAULT INSPECTING SERIES, DELAY FAULT SIMULATION METHOD AND DELAY FAULT INSPECTING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a quality evaluation method for delay fault inspecting series which can precisely evaluate the quality of delay fault inspecting series by taking a design delay value of a signal route which defines a delay fault into consideration. SOLUTION: The quality evaluation method for delay fault inspecting series excludes a delay fault which has a delay value lower than a predetermined design delay value out of the objects of the delay faults. The number of the remaining delay faults is used as a reference standard. An object to be compared is the number of delay faults which are detected by the quality evaluation method for delay fault inspecting series. By using a default detection ratio, which is the ratio of the object to be compared to the reference standard, quality of delay fault inspecting series is evaluated. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004251895(A) |
申请公布日期 |
2004.09.09 |
申请号 |
JP20040018603 |
申请日期 |
2004.01.27 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
TAKEOKA SADAMI;OTA MITSUHO |
分类号 |
G01R31/28;G01R31/319;G06F17/50;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
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