发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATING PROCESS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which dielectric loss of an element formed on an SOI layer can be reduced furthermore, and to provide its fabricating method. SOLUTION: A groove G is formed by removing a part of a supporting substrate 1. The groove G is formed directly under an element in which a dielectric loss due to the supporting substrate 1 is expected. Since a very thin silicon crystal exists or the silicon crystal does not exist in the groove G as a dielectric, dielectric loss of the overlying element becomes extremely small. When that element is employed as a component in a high frequency circuit, the high frequency circuit exhibits high response and stability with regard to processing of a high frequency signal. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004253488(A) 申请公布日期 2004.09.09
申请号 JP20030040333 申请日期 2003.02.18
申请人 OKI ELECTRIC IND CO LTD 发明人 KOBAYASHI MOTOKI;ICHIKAWA FUMIO
分类号 H01L21/822;H01L21/8234;H01L21/84;H01L23/522;H01L27/01;H01L27/04;H01L27/06;H01L27/08;H01L27/12;(IPC1-7):H01L27/12;H01L21/823 主分类号 H01L21/822
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