发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a rewritable nonvolatile semiconductor memory which can be intended to enhance a current characteristic, and to provide a method for manufacturing the semiconductor memory. SOLUTION: After an element isolated layer 2 is formed in a semiconductor substrate 1, a p-type well 3 is formed in the semiconductor substrate 1. After an n-type semiconductor region 4 is formed in the p-type well 3, a memory gate electrode 10 is formed on a specific region of the n-type semiconductor region 4. In a region which is on the n-type semiconductor region 4 and is adjacent to the memory gate electrode 10, a control gate electrode 18 of which a part runs onto the memory gate electrode 10 is formed. Thereafter, an n-type semiconductor region 19 is formed in the semiconductor substrate 1 beneath the control gate electrode 18 by ion implantation transmitting the control gate electrode 18. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004253700(A) 申请公布日期 2004.09.09
申请号 JP20030044227 申请日期 2003.02.21
申请人 RENESAS TECHNOLOGY CORP 发明人 GOTO TOSHIHIRO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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