发明名称 Electrostatic discharge protection circuit
摘要 An electrostatic discharge (ESD) protection circuit formed on a P-type substrate. The ESD protection circuit is disposed between a bonding pad and an internal circuit formed on a P-type substrate, and has a P-type metal-oxide semiconductor (PMOS) and an N-type metal-oxide semiconductor (NMOS). The PMOS has a first doped regionformed below a P<+> guard ring of the PMOS and a well pick-up of the PMOS. The NMOS has second doped regionformed below a N<+> guard ring of the NMOS and a well pick-up of the NMOS. An equivalent zener diode is formed on the P-type substrate. A breakdown of the equivalent zener diode restricts the PMOS or the NMOS from producing a snapback breakdown.
申请公布号 US6788507(B2) 申请公布日期 2004.09.07
申请号 US20020063074 申请日期 2002.03.17
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHEN SHIAO-SHIEN;TANG TIEN-HAO
分类号 H01L27/02;(IPC1-7):H02H9/00 主分类号 H01L27/02
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