发明名称 |
METHOD FOR FORMING DAMASCENE METAL LINE USING TITANIUM WETTING LAYER |
摘要 |
PURPOSE: A method for forming a damascene metal line is provided to reduce the manufacturing cost by using a barrier layer including a diffusion barrier and a titanium wetting layer as a barrier layer of a copper layer. CONSTITUTION: A bottom metal line(12), the first diffusion barrier(14), and an interlayer dielectric(16) are sequentially formed on an insulating layer(10) of a semiconductor substrate. An opening part is formed on the interlayer dielectric. The second diffusion barrier is formed on the inside of the opening part. The bottom metal line is exposed by removing the first and the second diffusion barriers from the bottom of the opening part. A wetting liner(38) is coated on the exposed bottom metal line and the second diffusion barrier of the sidewall of the opening part. A copper seed liner(40) is coated on the wetting liner.
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申请公布号 |
KR20040077042(A) |
申请公布日期 |
2004.09.04 |
申请号 |
KR20030012427 |
申请日期 |
2003.02.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HYO SANG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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