发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE, FOR SIMPLIFYING FABRICATING PROCESS |
摘要 |
PURPOSE: A method for forming a capacitor of a semiconductor device is provided to remove a photoresist strip process and simplify a fabrication process by performing an etch-back process after forming an adhesive layer. CONSTITUTION: An insulating layer pattern(110) having an opening part is formed on a semiconductor substrate(100). A lamination structure including a tungsten plug(130) and a barrier metal layer is formed within the opening part. The insulating layer pattern is etched partially. An adhesive layer(150) is formed on the entire surface of the resultant structure. An upper part of the barrier metal layer is exposed by etching the adhesive layer. A bottom electrode(160), a dielectric layer, and a top electrode are sequentially formed on the barrier metal layer.
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申请公布号 |
KR20040077156(A) |
申请公布日期 |
2004.09.04 |
申请号 |
KR20030012604 |
申请日期 |
2003.02.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, JUN HUI;CHO, YUN SEOK |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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