| 摘要 |
<P>PROBLEM TO BE SOLVED: To enable variations in characteristics and local defects inside an integrated thin film solar cell to be detected. <P>SOLUTION: A stage 2 where the integrated thin film solar cell 5 is mounted is provided inside a dark box 1, and a linear structure light source 4 which is capable of irradiating the integrated thin film solar cell 5 in a line is provided on the stage 2 so as to be moved in steps by a step drive 3. The lengthwise direction of the linear structure light source 4 is set coincident with the series connection direction of the cells of the integrated thin film solar cell. The linear structure light source 4 is fed in steps by the step drive 3 from one end of a solar cell light receiving surface to the other end, and the current-voltage characteristics of the light irradiated part of the integrated thin film solar cell 5 is measured at every stop position of the linear structure light source 4. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
