发明名称 Semiconductor device having high-piemittivity insulation film and production method therefor
摘要 A semiconductor device has a substrate and a dielectric film formed directly or indirectly on the substrate. The dielectric film contains a metal silicate film, and a silicon concentration in the metal silicate film is higher in a center portion in the film thickness direction than in an upper portion and in a lower portion.
申请公布号 US2004171276(A1) 申请公布日期 2004.09.02
申请号 US20030477109 申请日期 2003.11.10
申请人 WATANABE HEIJI;ONO HARUHIKO;IKARASHI NOBUYUKI 发明人 WATANABE HEIJI;ONO HARUHIKO;IKARASHI NOBUYUKI
分类号 H01L21/28;H01L21/316;H01L29/51;(IPC1-7):H01L21/31 主分类号 H01L21/28
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