发明名称 METHOD FOR COPPER CMP USING POLYMERIC COMPLEXING AGENTS
摘要 <p>The invention provides a method of polishing a substrate comprising a metal layer comprising copper. The method comprises the steps of (i) providing a chemical-mechanical polishing system comprising a liquid carrier, a polishing pad, an abrasive, and a negatively-charged polymer or copolymer, (ii) contacting the substrate with the poloshing system, and (iii) abrading at least a portion of the substrate to polish the metal layer of the substrate. The negatively-charged polymer or copolymer comprises one or more monomers selected from sulfonic acids, sulfonates, sulfates, phosphonic acids, phosphonates, and phosphates, has a molecular weight of about 20,000 g/mol or more, and coats at least a portion of the abrasive such that the abrasive has a zeta potential value that is lowered upon interaction of the negatively-charged polymer or copolymer with the abrasive.</p>
申请公布号 EP1451863(A2) 申请公布日期 2004.09.01
申请号 EP20020802586 申请日期 2002.12.03
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 SCHROEDER, DAVID J.;CARTER, PHILLIP;CHAMBERLAIN, JEFFREY, P.;MILLER, KYLE;CHERIAN, ISAAC, K.
分类号 B24B37/00;C09G1/02;C09K3/14;H01L21/304;H01L21/321;(IPC1-7):H01L21/321 主分类号 B24B37/00
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