发明名称 Personnel inspection system with x-ray line source
摘要 A personnel x-ray inspection system includes an electron source that provides a pencil beam of electrons. An electromagnet assembly receives the pencil beam of electrons and directs the beam of electrons along a line to form a scanning redirected beam under the control of a scan command signal. The scanning redirected beam strikes a target and generates a cone of x-rays that moves along a target line as a result of the scanning redirected beam. A collimator receives the scanning cone of x-rays and generates a collimated traveling pencil beam, which is directed to a person under inspection. A moving platform translates the person under inspection through the collimated traveling pencil beam. A backscatter detector detects backscattered x-rays, and provides a backscattered detected signal indicative thereof. A system controller provides the scan command signal, and also receives and processes the backscattered detected signal.
申请公布号 US6785360(B1) 申请公布日期 2004.08.31
申请号 US20020288244 申请日期 2002.11.05
申请人 ANNIS MARTIN 发明人 ANNIS MARTIN
分类号 A61B6/03;(IPC1-7):H01J35/30 主分类号 A61B6/03
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