发明名称 Flash memory device and a method for fabricating the same
摘要 A flash memory having a charge-storage dielectric layer and a method for forming the same are provided. According to one embodiment, charge-storage dielectric layers are formed over the first and second active regions. The charge-storage layer over the first active region is not connected to the charge-storage layer over the second active region. A gate line overlies the charge-storage layer and extends across the first and second active regions and the isolation region. The charge-storage layer can be formed only where a gate line intersects an active region of a semiconductor substrate, not on an isolation region. Thus, undesirable influence or disturbance from adjacent memory cells can be avoided.
申请公布号 US6784055(B2) 申请公布日期 2004.08.31
申请号 US20030418701 申请日期 2003.04.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN YOU-CHEOL;PARK JONG-WOO;CHOI JUNG-DAL
分类号 H01L21/8247;H01L21/8246;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336;H01L29/76 主分类号 H01L21/8247
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