发明名称 Method of manufacturing semiconductor device
摘要 A semiconductor device manufacturing method comprises forming a first insulating film including silicon, carbon, nitrogen, and hydrogen above a substrate in a first chamber, carrying the substrate into a second chamber other than the first chamber, and discharging a rare gas in the second chamber, and forming a second insulating film including silicon, carbon, oxygen, and hydrogen above the first insulating film after the discharging the rare gas.
申请公布号 US2004166680(A1) 申请公布日期 2004.08.26
申请号 US20030726678 申请日期 2003.12.04
申请人 MIYAJIMA HIDESHI;HIGASHI KAZUYUKI;FUJITA KEIJI;HASEGAWA TOSHIAKI;TABUCHI KIYOTAKA 发明人 MIYAJIMA HIDESHI;HIGASHI KAZUYUKI;FUJITA KEIJI;HASEGAWA TOSHIAKI;TABUCHI KIYOTAKA
分类号 C23C16/42;C23C16/50;H01L21/3105;H01L21/311;H01L21/314;H01L21/316;H01L21/768;H01L23/522;(IPC1-7):H01L21/302;H01L21/461 主分类号 C23C16/42
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