发明名称 CMP slurry polysilicon and method of forming semiconductor device using the same
摘要 A Chemical Mechanical Polishing(abbreviated as "CMP") slurry composition for polysilicon and method of forming a self-aligned floating gate of a flash memory device are disclosed for performing CMP process using slurry having higher polishing selectivity to polysilicon than to isolation oxide film which is an etching barrier film.
申请公布号 US2004163324(A1) 申请公布日期 2004.08.26
申请号 US20020334295 申请日期 2002.12.31
申请人 LEE SANG ICK;KIM HYUNG HWAN 发明人 LEE SANG ICK;KIM HYUNG HWAN
分类号 C09G1/02;C09K3/14;C09K13/04;H01L21/304;H01L21/321;(IPC1-7):C09K3/14 主分类号 C09G1/02
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