发明名称 |
Variable impedance test probe |
摘要 |
A variable impedance test probe of the present invention comprises a first signal conductor, a first ground reference conductor, and a first dielectric element disposed between the first signal conductor and the first ground reference conductor. The dielectric element is configured to selectively vary an impedance of the first signal conductor relative to the ground reference conductor.
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申请公布号 |
US2004164748(A1) |
申请公布日期 |
2004.08.26 |
申请号 |
US20030370537 |
申请日期 |
2003.02.20 |
申请人 |
CHHEDA SACHIN NAVIN;DOBBS ROBERT WILLIAM;BARR ANDREW |
发明人 |
CHHEDA SACHIN NAVIN;DOBBS ROBERT WILLIAM;BARR ANDREW |
分类号 |
G01R1/067;G01R1/073;G01R27/28;G01R31/02;G01R31/28;(IPC1-7):G01R27/28 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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