发明名称 METHOD FOR FABRICATING MOSFET HAVING POCKET REGION
摘要 PURPOSE: A method for fabricating a MOSFET having a pocket region is provided to restrict a short channel effect by controlling the density and a position of the pocket region. CONSTITUTION: A gate electrode layer is formed on a semiconductor substrate(50). An LDD region is formed on the semiconductor substrate by implanting ions. A blocking layer pattern including plural blocking layers(64,66) is formed on the semiconductor substrate. A pocket region is formed on the semiconductor substrate by performing an ion implantation process using the gate electrode layer and the blocking layer pattern as ion implantation masks. The blocking layer is removed therefrom. A spacer is formed on a sidewall of the gate electrode layer. A deep source/drain region is formed on the semiconductor substrate by performing an ion implantation process using the gate electrode layer as the ion implantation mask.
申请公布号 KR20040074836(A) 申请公布日期 2004.08.26
申请号 KR20030010323 申请日期 2003.02.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, HUI SEONG;KO, YEONG GEON;LEE, SANG JIN;OH, CHANG BONG;PARK, CHANG HYEON
分类号 H01L29/78;H01L21/265;H01L21/336;H01L29/10;(IPC1-7):H01L29/78 主分类号 H01L29/78
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