发明名称 SEMICONDUCTOR DEVICE FOR STATIC ELECTRICITY PROTECTION AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a new semiconductor device for static electricity protection and a semiconductor device containing the semiconductor device for static electricity protection. SOLUTION: The semiconductor device 100 for static electricity protection contains a first-conductivity first region 14 and a second-conductivity second region 12 formed in a first-conductivity semiconductor substrate 10. The second region 12 contains a first-conductivity first impurity diffusing layer 22 and a first-conductivity second impurity diffusing layer 24 adjoining the layer 22. The first region 14 contains a first-conductivity third impurity diffusing layer 26. The second impurity diffusing layer 24 is formed so that a depletion layer 24a formed under the layer 24 may be connected to the semiconductor substrate 10 when the positive voltage of a prescribed value is impressed upon the first impurity diffusing layer 22. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004241562(A) 申请公布日期 2004.08.26
申请号 JP20030028456 申请日期 2003.02.05
申请人 SEIKO EPSON CORP 发明人 SATO YUTAKA
分类号 H01L27/04;H01L21/822;H01L21/8234;H01L27/06;H01L27/088;(IPC1-7):H01L27/06;H01L21/823 主分类号 H01L27/04
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