BOUNDARY SCAN CONTROLLER, SEMICONDUCTOR DEVICE, METHOD FOR IDENTIFYING SEMICONDUCTOR CIRCUIT CHIP OF SEMICONDUCTOR DEVICE, AND METHOD FOR CONTROLLING SEMICONDUCTOR CIRCUIT CHIP OF SEMICONDUCTOR DEVICE

摘要

A boundary scan controller that allows a boundary scan to be executed and also allows a semiconductor device to be manufactured in such a manner that the same type of semiconductor circuit chips are stacked. Comparison means (88) is used to compare identification data stored in memory means (85) with fixed data held in fixed-data holding means (87). When the identification data is coincident with the fixed data, a data deriving part (89) outputs the same data as an output part (86) does. In a boundary scan test, a data deriving part (89) of a boundary controller (80) provided for each semiconductor circuit chip is connected to the same bus line. When the identification data is not coincident with the fixed data, the data deriving part (89) can be substantially disconnected from the bus line. In this way, the same type of semiconductor circuit chips for which the boundary controller (80) is provided can be stacked, thereby manufacturing the semiconductor device.