发明名称 CMP APPARATUS
摘要 PURPOSE: A CMP apparatus is provided to improve polishing uniformity of a wafer by expanding uniformly a membrane in a polishing process. CONSTITUTION: A polishing pad is installed on an upper surface of a platen. A polishing head(200) is used for polishing a semiconductor substrate by pressing the semiconductor substrate on the polishing pad. The polishing head includes a support plate(224) installed on a bottom of the polishing head, a membrane(240) having a pressing part, the first fixing part, and the second fixing part, and a clamp(226) for fixing the membrane. A plurality of holes are formed on the support plate. A plurality of holes are formed on the pressing part.
申请公布号 KR20040074269(A) 申请公布日期 2004.08.25
申请号 KR20030009793 申请日期 2003.02.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, GI HONG;KIM, IK JU;KIM, SANG JUN
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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