发明名称 |
CMP APPARATUS |
摘要 |
PURPOSE: A CMP apparatus is provided to improve polishing uniformity of a wafer by expanding uniformly a membrane in a polishing process. CONSTITUTION: A polishing pad is installed on an upper surface of a platen. A polishing head(200) is used for polishing a semiconductor substrate by pressing the semiconductor substrate on the polishing pad. The polishing head includes a support plate(224) installed on a bottom of the polishing head, a membrane(240) having a pressing part, the first fixing part, and the second fixing part, and a clamp(226) for fixing the membrane. A plurality of holes are formed on the support plate. A plurality of holes are formed on the pressing part.
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申请公布号 |
KR20040074269(A) |
申请公布日期 |
2004.08.25 |
申请号 |
KR20030009793 |
申请日期 |
2003.02.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, GI HONG;KIM, IK JU;KIM, SANG JUN |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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