发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which can cope with temperature change in a wide range without needing a peripheral device. SOLUTION: The semiconductor integrated circuit 1 is provided with a temperature sensing circuit 6 for measuring a temperature of the circuit 1, a plurality of blocking circuits 4, 5 classified by temperature whose circuit functions adapted for different temperature range are identical, a common temperature blocking circuit 3 which is adapted for all of the different temperature ranges, and an operation blocking switching control circuit 7 which operates one blocking circuit classified by temperature out of the plurality of blocking circuits 4, 5 by a temperature measured with the sensing circuit 6, and stops the operation of the residual blocking circuits which are not selected. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004235179(A) 申请公布日期 2004.08.19
申请号 JP20030018228 申请日期 2003.01.28
申请人 TOSHIBA CORP 发明人 KANEKO YOSHIO
分类号 H01L27/04;H01L21/822;(IPC1-7):H01L21/822 主分类号 H01L27/04
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