| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an optical pickup capable of accurately obtaining the deterioration degree of a semiconductor laser. <P>SOLUTION: By using an optical integrated unit 5 in which an LD 22 and a light receiving element 23 are integrated into a hollow package 21, a display part 26 indicating an initial operation current value for driving the LD 22 is imprinted on the backside of the hollow package 21 at the maker of the optical integrated unit 5, and then the optical integrated unit 5 is shipped to a set maker. On the other hand, at the set maker, the received optical integrated unit 5 is incorporated together with a movable part and an electromagnetic driving device into an optical chassis 2 to assemble an optical pickup 1, the increase of the current operation current value of the LD 22 from the initial value is obtained by comparing the operation current value of this time with that shown on the display part 26, and the LD 22 of a large damage amount is determined as a defective product at this time point. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
