发明名称 |
METHOD AND APPARATUS FOR INSPECTING PIXELS OF DISPLAY DEVICE |
摘要 |
PURPOSE: A method and an apparatus for inspecting pixels of a display device are provided to accurately obtain voltage and pixel capacity of gate lines, data lines, and an individual pixel, and accurately inspect inferiority and a position of each pixel. CONSTITUTION: A transistor(130) connected with a target pixel area(140) to be inspected is operated through related gate lines(111). The target pixel area is charged into predetermined pixel capacity by a pixel voltage through related data lines(121) of the transistor connected with the target pixel area to be inspected. The charged pixel capacity is inputted to amplifying circuit parts(150) installed inside or outside of a display device. The pixel capacity of the target pixel area is amplified into a predetermined level by the amplifying circuit parts so that the pixel capacity is inspected.
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申请公布号 |
KR20040073104(A) |
申请公布日期 |
2004.08.19 |
申请号 |
KR20030009073 |
申请日期 |
2003.02.13 |
申请人 |
KONG, JAE YOUN |
发明人 |
CHUN, PUNG HWAN;KONG, JAE YOUN;LEE, SEUNG JAE |
分类号 |
G02F1/13;(IPC1-7):G02F1/13 |
主分类号 |
G02F1/13 |
代理机构 |
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