发明名称 Static random access memory and semiconductor device using MOS transistors having channel region electrically connected with gate
摘要 In an SRAM, memory cells are each constructed of four NMOS transistors and two PMOS transistors 25 and 26. The four NMOS transistors are each constructed of DTMOS in which the channel region is electrically connected to the gate. In each NMOS transistor, a threshold voltage Vth is lower in an ON stage than in an OFF stage. The threshold voltage Vth in the OFF stage is equivalent to that of an ordinary NMOS transistor in which the channel region is not electrically connected to the gate. Read and write circuits of the SRAM also include MOS transistors formed of DTMOS in which the channel region is electrically connected to the gate.
申请公布号 US2004159905(A1) 申请公布日期 2004.08.19
申请号 US20040774536 申请日期 2004.02.10
申请人 SHARP KABUSHIKI KAISHA 发明人 SATO YUICHI
分类号 G11C11/413;G11C11/412;H01L21/8244;H01L27/11;H01L29/78;(IPC1-7):H01L29/00 主分类号 G11C11/413
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