发明名称 RFID device tester and method
摘要 An RFID device tester includes coupling elements for capacitively coupling a reader to an RFID device to be tested. The reader may power the RFID device by sending an outgoing signal, such as an outgoing AC power signal, which may be rectified and/or reflected by the RFID device, if the RFID device is operating properly. The outgoing signal may have a frequency that is different from the resonant frequency of an antenna of the RFID device. A reader in the RFID device tester detects the reflected and/or transmitted signal to confirm proper operation of the RFID device. The RFID device tester may be used as part of a roll-to-roll process, to individually test RFID devices on a roll of material. By utilizing short-range capacitive coupling, difficulties caused by simultaneous activation of multiple RFID devices may be reduced or avoided.
申请公布号 US2004160233(A1) 申请公布日期 2004.08.19
申请号 US20030367515 申请日期 2003.02.13
申请人 FORSTER IAN J. 发明人 FORSTER IAN J.
分类号 G06K7/00;(IPC1-7):G01R27/26 主分类号 G06K7/00
代理机构 代理人
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