| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing method, in which some of same integrated circuit (IC) chips are tested, in parallel with asynchronous actions via two physical connections between a circuit tester and each chip. SOLUTION: The testing method comprises the means of outputting a 1st test control signal from a tester to the IC chip; conducting test by each IC chip using an asynchronized method; outputting a 2nd result request signal from the voltmeter to the IC chip, after outputting the 1st control signal and following a prescribed time interval; and making all the chips to respond synchronously when the 2nd control signals are received. COPYRIGHT: (C)2004,JPO&NCIPI |
