发明名称 Thick wafer processing and resultant products
摘要 A thick wafer is diced by partially dicing a first side to form a first dice, flipping the wafer so that the first side is now in contact with a dicing tape, and dicing a second side. The dicing of the second side may be achieved by aligning a dicing tool to the first dice and/or alignment marks on the wafer. The thick wafer may be a composite wafer including two or more wafers bonded together. These two wafers may be different thicknesses and/or different materials.
申请公布号 US6777311(B2) 申请公布日期 2004.08.17
申请号 US20020087989 申请日期 2002.03.05
申请人 DIGITAL OPTICS CORP. 发明人 HAN HONGTAO;MATHEWS JAY
分类号 H01L27/14;G02B6/42;H01L21/301;H01S5/02;(IPC1-7):H01L21/301 主分类号 H01L27/14
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