发明名称 |
ION IMPLANTATION DEVICE AND METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide an ion implantation device and an ion implantation method which can suppress the variation in an implantation angle due to a position on a wafer when ion implantation is carried out by a batch process method, and in which setting and varying of a tilt angle are easily carried out. SOLUTION: The ion implantation device provided with a disk 2 and a plurality of wafer retaining parts 3 retaining wafers 1 is provided. The disk 2 is constituted to be able to be rotated in the circumferential direction. The wafer retaining parts 3 are connected to the outer periphery of the disk 2 so that the angleψformed by a rotating plane 2a of the disk 2 and a main surface of the wafer 1 retained in the wafer retaining part 3 is variable, through a connecting member 4 provided with a hinge member 5. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004227958(A) |
申请公布日期 |
2004.08.12 |
申请号 |
JP20030015332 |
申请日期 |
2003.01.23 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NIWAYAMA MASAHIKO;TAKAHASHI KAZUMA |
分类号 |
H01J37/317;H01L21/265;(IPC1-7):H01J37/317 |
主分类号 |
H01J37/317 |
代理机构 |
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代理人 |
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地址 |
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