发明名称 Ge-Cr ALLOY SPUTTERING TARGET AND METHOD FOR MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a Ge-Cr alloy sputtering target which suppresses dispersion of the film deposition speed and the film composition of a GeCrN layer to be film-deposited by the reactive sputtering as an intermediate layer between the recording layer and the protective layer of a phase change optical disk, and consequently enhances the product yield and a method for manufacturing the same. <P>SOLUTION: The Ge-Cr alloy sputtering target containing Cr of 5-50 atm.% is characterized in that the Ge-Cr alloy sputtering target has a relative relative density of &ge; 95%. In the method for manufacturing the Ge-Cr alloy sputtering target, Cr powder having an undersize of 75 &mu;m, and Ge powder having an undersize of 250 &mu;m and a BET specific surface area of &le; 0.4 m<SP>2</SP>/g are uniformly dispersed and mixed, and sintered. <P>COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004225139(A) 申请公布日期 2004.08.12
申请号 JP20030017025 申请日期 2003.01.27
申请人 NIKKO MATERIALS CO LTD 发明人 TAKAMI HIDEO;YASUJIMA HIROHISA
分类号 B22F1/00;B22F3/10;C22C1/04;C22C28/00;C22C30/00;C23C14/34;G11B5/851;G11B7/243;G11B7/254;G11B7/257;G11B7/26 主分类号 B22F1/00
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