发明名称 CAPACITOR IN AN INTERCONNECT SYSTEM AND METHOD OF MANUFACTURING THEREOF
摘要 A fabrication method for an integrated device having a capacitor in an interconnect system is described. At least a first exposed metal line and a second metal line are provided in an insulating layer. A stack layer is deposited and patterned to form a film stack structure over the second metal line. An inter-metal dielectric layer is formed over the film stack structure, the first metal line and the insulating layer. At least a first dual damascene interconnect and a second dual damascene interconnect are formed over and in contact with the first metal line and the film stack structure, respectively.
申请公布号 US2004157392(A1) 申请公布日期 2004.08.12
申请号 US20030248833 申请日期 2003.02.24
申请人 HAO MING-YIN;YEW TRI-RUNG;CHEN COMING;HSIEH TSONG-MINN;PENG NAI-CHEN;YEH JIH-CHENG 发明人 HAO MING-YIN;YEW TRI-RUNG;CHEN COMING;HSIEH TSONG-MINN;PENG NAI-CHEN;YEH JIH-CHENG
分类号 H01L21/02;H01L21/768;H01L23/522;(IPC1-7):H01L21/20;H01L21/476;H01L21/824 主分类号 H01L21/02
代理机构 代理人
主权项
地址