A METHOD OF SAMPLE PREPARATION FOR ATOM PROBES AND SOURCE OF SPECIMENS
摘要
Specimens (24) made for use in atom probe analysis, which include a plurality of posts (24) in a slab (16) of material for making the specimens (24). The post (24) is shaped to a tip shape (24) suitable for use in the atom probe.
申请公布号
WO2004013603(A3)
申请公布日期
2004.08.12
申请号
WO2003US23733
申请日期
2003.07.29
申请人
CALIFORNIA INSTITUTE OF TECHNOLOGY;KUHLMAN, KIMBERLY;WISHARD, JAMES, R.
