发明名称 METHOD FOR COMPENSATION OF MEASUREMENT ERROR, METHOD FOR QUALITY DECISION OF ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT CHARACTERISTICS MEASURING SYSTEM
摘要 PROBLEM TO BE SOLVED: To correct a measurement result of actual measurement which does not completely agree with a reference measurement device similarly to the measurement result of the reference measurement device. SOLUTION: The impedance of data acquisition sample 11B for correction is measured with a reference measurement device 1 and an actual measurement device 2, respectively, and a correlation between the measurement result by the actual measurement device 2 and the measurement result by the reference measurement device 1 is obtained. By calculating the impedance of a measuring object electric component 11A measured with the actual measurement device 2 by substituting in the correlation, the impedance of the measuring object electric component 11A is corrected to an impedance estimated when measured with the reference measurement device 1. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004226105(A) 申请公布日期 2004.08.12
申请号 JP20030011164 申请日期 2003.01.20
申请人 MURATA MFG CO LTD 发明人 KAMIYA TAKESHI
分类号 G01R27/02;G01R35/00;(IPC1-7):G01R27/02 主分类号 G01R27/02
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