发明名称 |
BAKE UNIT FOR SEMICONDUCTOR FABRICATING PROCESS |
摘要 |
PURPOSE: A bake unit for a semiconductor fabricating process is provided to improve uniformity of a resist pattern CD(critical dimension) by heating the upper and lower surfaces of a wafer to a uniform temperature while using a dual plate in a PEB(post exposure bake) process for a photolithography process. CONSTITUTION: The wafer(2) is placed on a wafer plate. A heater inside the wafer plate is driven to indirectly heat the wafer so that a bake process is performed. The wafer plate includes a lower plate(210) for heating the lower surface of the wafer and an upper plate(220) for heating the upper surface of the wafer.
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申请公布号 |
KR20040070818(A) |
申请公布日期 |
2004.08.11 |
申请号 |
KR20030007007 |
申请日期 |
2003.02.04 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
LEE, IL HO |
分类号 |
H01L21/324;(IPC1-7):H01L21/324 |
主分类号 |
H01L21/324 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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