发明名称 BAKE UNIT FOR SEMICONDUCTOR FABRICATING PROCESS
摘要 PURPOSE: A bake unit for a semiconductor fabricating process is provided to improve uniformity of a resist pattern CD(critical dimension) by heating the upper and lower surfaces of a wafer to a uniform temperature while using a dual plate in a PEB(post exposure bake) process for a photolithography process. CONSTITUTION: The wafer(2) is placed on a wafer plate. A heater inside the wafer plate is driven to indirectly heat the wafer so that a bake process is performed. The wafer plate includes a lower plate(210) for heating the lower surface of the wafer and an upper plate(220) for heating the upper surface of the wafer.
申请公布号 KR20040070818(A) 申请公布日期 2004.08.11
申请号 KR20030007007 申请日期 2003.02.04
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 LEE, IL HO
分类号 H01L21/324;(IPC1-7):H01L21/324 主分类号 H01L21/324
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