发明名称 Memory cell structure integrated on semiconductor
摘要 This invention relates to a memory cell which comprises a capacitor having a first electrode and a second electrode separated by a dielectric layer. Such dielectric layer comprises a layer of a semi-insulating material which is fully enveloped by an insulating material and in which an electric charge is permanently present or trapped therein. Such electric charge accumulated close to the first or to the second electrode, depending on the electric field between the electrodes, thereby defining different logic levels.
申请公布号 US6772992(B1) 申请公布日期 2004.08.10
申请号 US20000701768 申请日期 2000.11.30
申请人 STMICROELECTRONICS S.R.L. 发明人 LOMBARDO SALVATORE;GERARDI COSIMO;CRUPI ISODIANA;MELANOTTE MASSIMO
分类号 H01L21/8247;H01L21/8242;H01L27/108;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 H01L21/8247
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