| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor testing device that can hold the data stored in a test pattern memory even when power supply is shut off. <P>SOLUTION: This semiconductor testing device 1 having a pattern memory circuit 12 used for performing functional tests on semiconductor integrated circuits is provided with a backup power source 14 which supplies electric power to the pattern memory circuit 12 when the power supply from a power supply unit 11 which supplies electric power to the pattern memory circuit 12 at normal time is shut off. <P>COPYRIGHT: (C)2004,JPO&NCIPI |
