发明名称 APPARATUS FOR DETECTING SURFACE FLAW IN BILLET
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an apparatus for detecting surface flaws in billets capable of highly accurately detecting flaws and defects with satisfactory visibility without being affected by the surface properties of the billets regardless of whether the billets are preprocessed materials or nonpreprocessed materials. <P>SOLUTION: This apparatus is for detecting flaw parts in the surface of preprocessed or nonpreprocessed billets. In the apparatus, a pair of illumination devices are arranged in such a way as to be opposed to each other along the direction of the movement of a billet for irradiating a prescribed area in the surface of the moving billet from two directions. An imaging device is arranged between the pair of illumination devices for imaging the state of the surface of the billet by receiving illumination light incident from the illumination devices and reflected at the surface of the billet in a direction approximately perpendicular to the surface of the billet. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004219358(A) 申请公布日期 2004.08.05
申请号 JP20030009267 申请日期 2003.01.17
申请人 NIPPON STEEL CORP 发明人 HATANO TOSHIKAZU;TAKAHASHI AKIRA
分类号 G01B11/04;B21C51/00;G01N21/892;(IPC1-7):G01N21/892 主分类号 G01B11/04
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