发明名称 MANUFACTURING METHOD OF IC INLET, ID TAG, ID TAG READER, AND DATA READING METHOD FOR THE ID TAG AND TAG READER
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for precisely inspecting whether an IC inlet to be inspected is good in quality under the condition that many IC inlets are formed on an insulating film. <P>SOLUTION: The inspection of the IC inlet 1 formed on the insulating film 2 is carried out by transmitting a microwave to the inlet 1 from an antenna 41. In order to selectively transmit the microwave only to one IC inlet 1 to be inspected among the many IC inlets 1 formed on the insulating film 2, a radio wave absorbing plate 49 is inserted between the insulating film 2 and the antenna 41, and the microwave is irradiated to the IC inlet 1 through a slit 50 provided in the radio wave absorbing plate 49. In the radio wave absorbing plate 49, the slit 50, which is nearly the same in size as the IC inlet 1, is provided in the part of a plane plate made of a radio wave absorbing body. <P>COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004220141(A) 申请公布日期 2004.08.05
申请号 JP20030004099 申请日期 2003.01.10
申请人 RENESAS TECHNOLOGY CORP;RENESAS EASTERN JAPAN SEMICONDUCTOR INC 发明人 OKAMOTO MICHIO;YAMAGATA TOSHIO;MURAKAMI NOBUO;KAKIYA KEIZO;FUJIWARA HIDEHIRO;SAITO TAKESHI
分类号 G01N22/04;G06K7/08;G06K17/00;G06K19/07;G06K19/077;H01L21/02;H01L21/56;H01L21/60;H01L21/66;H01L23/498;H01Q1/22;H01Q17/00 主分类号 G01N22/04
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