发明名称 |
Apparatus and method for testing integrated circuits using weighted pseudo-random test patterns |
摘要 |
A method for testing an electronic circuit includes selecting an input signal using a first multiplexer, selecting a signal to be input to the first multiplexer using at least one other multiplexer, and controlling the at least one other multiplexer using a selection signal output from a control circuit.
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申请公布号 |
US2004153916(A1) |
申请公布日期 |
2004.08.05 |
申请号 |
US20030358461 |
申请日期 |
2003.02.04 |
申请人 |
KIRYU NAOKI;BUSHARD LOUIS B. |
发明人 |
KIRYU NAOKI;BUSHARD LOUIS B. |
分类号 |
G01R31/28;G01R31/3185;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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