Method and apparatus for adaptively performing defect scan according to channel characteristics

摘要

A method for performing a defect scan according to the characteristics of channels of a data storage system by determining design parameters based on the channel characteristics includes measuring characterization values related to the performance for channels of the data storage system; determining parameters for the respective channels based on the measured characterization values, the parameters for determining the data processing characteristics of the respective channel; and performing a defect scan on the data storage system using the determined parameters in a data processing process for the respective channels.