发明名称 |
Signal pin tester for AC defects in integrated circuits |
摘要 |
A test apparatus and a method for testing an integrated circuit's data storage device's input/output signal pins for alternating current (AC) defects, by providing an interface that will couple each respective individual test contact, in a subset of said contacts, to a select plurality of the data storage input/output signal pins so that when a selected data string is introduced into the integrated circuit so that each input/output pin on a data storage device in the integrated circuit will be tested in sequence whereby the number of contacts required by the tester can be reduced.
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申请公布号 |
US2004153919(A1) |
申请公布日期 |
2004.08.05 |
申请号 |
US20030420431 |
申请日期 |
2003.04.21 |
申请人 |
ANGELOTTI FRANK W.;BUSHARD LOUIS B.;GRADY MATTHEW S.;STRISSEL SCOTT A. |
发明人 |
ANGELOTTI FRANK W.;BUSHARD LOUIS B.;GRADY MATTHEW S.;STRISSEL SCOTT A. |
分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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