发明名称 Semiconductor device manufacturing method for improving adhesiveness of copper metal layer to barrier layer
摘要 A method of manufacturing a semiconductor device according to the present invention forms a laminate metal film having a copper metal layer and a barrier metal, and once immerses the laminate metal film in a solution including an organic acid having at least one carboxyl group before a heat treatment, thereby removing from the laminate metal film an oxide which is the source of oxygen that diffuses during the heat treatment. <IMAGE>
申请公布号 EP1443551(A2) 申请公布日期 2004.08.04
申请号 EP20040001235 申请日期 2004.01.21
申请人 NEC ELECTRONICS CORPORATION 发明人 OKADA, NORIO
分类号 H01L21/3205;H01L21/02;H01L21/306;H01L21/321;H01L21/3213;H01L21/44;H01L21/4763;H01L21/768;H01L23/52;(IPC1-7):H01L21/768 主分类号 H01L21/3205
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