| 摘要 |
PROBLEM TO BE SOLVED: To provide a test cost calculation system which reduces a burden of a person who is in charge of calculating a test cost of a semiconductor device and also increases reliability in calculated results. SOLUTION: There are provided an information collecting means 4a for procuring product standard information prescribing contents of a test product, test standard information prescribing contents of a test, and factory operation standard information prescribing a test operation plan of each factory from outside via a communication line 6 to store each information as a database; and a test cost calculating means 4b for using each of the above information collected by this information collecting means 4a to calculate the test cost in testing based on a predetermined calculation formula. COPYRIGHT: (C)2004,JPO&NCIPI
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