发明名称 VERTICAL TYPE INSULATED GATE FIELD EFFECT TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a vertical type insulated gate field effect transistor reduced in the number of manufacturing process compared with that of a conventional field effect transistor, without increasing the rate of an area occupied by the chip of a bidirectional Zener diode formed in the same chip by the shape of a diffusion layer as the protective diode of a power MOSFET. SOLUTION: The vertical type insulated gate field effect transistor is provided with a P-base region 25 and, at the same time, a P-type diffusion layer 23 having a pattern area smaller than the P-base region 25, which are formed in an N<SP>-</SP>-drain region 21, and an N<SP>+</SP>-type source region 26 and, at the same time, N<SP>+</SP>-type diffusion layer 24, which are formed in the P-type diffusion layer 23, while the bidirectional Zener diode Z<SB>DG</SB>connected between the drain gates is constituted of the N<SP>-</SP>-drain region 21, the P-type diffusion layer 23, and the N<SP>+</SP>-type diffusion layer 24. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004214353(A) 申请公布日期 2004.07.29
申请号 JP20020380981 申请日期 2002.12.27
申请人 NEC KANSAI LTD 发明人 MATSUURA NAOKI
分类号 H01L27/04;H01L21/822;H01L27/06;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L27/04
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