发明名称 Scan controller and integrated circuit including such a controller
摘要 An integrated circuit is provided in which a scan controller for controlling a scan test is integrated within the integrated circuit and shares the same input pins as a serial programmable interface of the integrated circuit.
申请公布号 US2004148553(A1) 申请公布日期 2004.07.29
申请号 US20030406872 申请日期 2003.04.04
申请人 ANALOG DEVICES, INC. 发明人 NALBANTIS DIMITRIS
分类号 G01R31/3185;(IPC1-7):G01R31/28 主分类号 G01R31/3185
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