发明名称 |
TRANSISTOR, MANUFACTURING METHOD THEREOF, SEMICONDUCTOR INTEGRATED CIRCUIT, AND DISPLAY |
摘要 |
PROBLEM TO BE SOLVED: To manufacture a transistor having a good electrical characteristic by a low-temperature process. SOLUTION: In the manufacturing method of the transistor, a first interface reforming film 11 including a metal film or a semiconductor film is so formed on a substrate 10 as to form successively an insulation film 12 and a semiconductor film 13 on the first interface reforming film 11. Then, the decompositions of gases infiltrated in the insulation film 12 are promoted by a heat treatment, and dangling bonds present in the interface of the rear-surface side of the semiconductor film 13 (the interface present on the reverse side of a gate insulation film 15) are so terminated by the hydrogen radical, etc. generated by the decompositions as to reduce the interfacial-level density of the transistor. COPYRIGHT: (C)2004,JPO&NCIPI |
申请公布号 |
JP2004214546(A) |
申请公布日期 |
2004.07.29 |
申请号 |
JP20030002204 |
申请日期 |
2003.01.08 |
申请人 |
SEIKO EPSON CORP |
发明人 |
ABE DAISUKE;KIMURA MUTSUMI |
分类号 |
G02F1/1368;H01L21/20;H01L21/336;H01L29/786;H01L51/50;H05B33/10;H05B33/14;(IPC1-7):H01L21/336;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|