发明名称 Production of semiconductor structure using anisotropically structured spacer layer with side wall spacers useful in semiconductor technology
摘要 Preparation of a semiconductor structure in which over a semiconductor region with at least one trench (G), a carbon spacer layer (40) is anisotropically structured for removal of the spacer layer from the trench base, so that side wall spacers (40') remain at the trench walls away from the spacer layer (40).
申请公布号 DE10304862(A1) 申请公布日期 2004.07.22
申请号 DE20031004862 申请日期 2003.02.06
申请人 INFINEON TECHNOLOGIES AG 发明人 GENZ, OLIVER;WEGE, STEPHAN
分类号 H01L21/311;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/311
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