发明名称 HALFTONE PHASE SHIFT MASK BLANK AND HALFTONE PHASE SHIFT MASK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a halftone phase shift mask blank in which the transmittance can be easily controlled without varying phase difference by controlling the refractive index of the transmittance controlling layer to a desired value in a shifter layer comprising a phase difference controlling layer and the transmittance controlling layer, and a halftone phase shift mask. <P>SOLUTION: The halftone phase shift mask blank 10 has the shifter layer 4 comprising the transmittance controlling layer having the refractive index n satisfying 0.9≤n≤1.1 and the extinction coefficient k satisfying 1.0<k and the phase difference controlling layer 3 having the phase difference controlled to 180, on a transparent substrate 1. A resist pattern 5 is formed on the halftone phase shift mask blank 10, the shifter layer 4 is patterned by dry etching or the like, and the resist pattern 5 is removed to obtain the halftone phase shift mask 100 having the shift pattern 4a comprising a transmittance controlling pattern 2a and a phase difference controlling pattern 3a. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004205921(A) 申请公布日期 2004.07.22
申请号 JP20020376714 申请日期 2002.12.26
申请人 TOPPAN PRINTING CO LTD 发明人 IWAKATA MASAHIDE;SAGA TADASHI;MATSUO TADASHI
分类号 G03F1/32;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/32
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